Презентация на тему Optical identification using imperfections in 2D materials

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2. IntroductionThe ability to uniquely identify an object
3.
4. ObjectiveTo analise a proposed simple optical technique to read unique information from nanometer-scale defects in 2D materials.
5. TasksMethodResults for WS2 from mechanically exfoliationResults for WS2 from chemical vapor depositionConclusion
6. MethodMeasurement apparatus, in which the photoluminescence from
7. Angular orientations of the BPF determines the
8. Concept of the angular selective transmissionChanging the
9. Makeup of PUFThe BPF angular orientation θ, the
10. Results for WS2 from mechanically exfoliation
11. Results for WS2 from chemical vapor depositionAngular-dependent
12. Angular dependent PL images of WS2 monolayer
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IntroductionThe ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce.

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Optical identification using imperfections in 2D materials

Optical identification using imperfections in 2D materials

IntroductionThe ability to uniquely identify an object or device is important for

ObjectiveTo analise a proposed simple optical technique to read unique information from nanometer-scale defects in 2D materials.

TasksMethodResults for WS2 from mechanically exfoliationResults for WS2 from chemical vapor depositionConclusion

MethodMeasurement apparatus, in which the photoluminescence from a monolayer TMD is collected

Angular orientations of the BPF determines the center-wavelength of its pass band,

Concept of the angular selective transmissionChanging the BPF angle lights up a

Makeup of PUFThe BPF angular orientation θ, the corresponding BPF bandwidth, and the

Results for WS2 from mechanically exfoliation 50× Optical image of the

Results for WS2 from chemical vapor depositionAngular-dependent PL images of monolayer flake, excited

Angular dependent PL images of WS2 monolayer flake, excited by 450 nm laser,

ConclusionSpatial non-uniform photoluminescence is more pronounced for chemical vapor grown flakes than

Слайды презентации

Слайд 2 Introduction
The ability to uniquely identify an object or

IntroductionThe ability to uniquely identify an object or device is important

device is important for authentication. Imperfections, locked into structures

during fabrication, can be used to provide a fingerprint that is challenging to reproduce.

Слайд 3

Слайд 4 Objective
To analise a proposed simple optical technique to read

unique information from nanometer-scale defects in 2D materials.

Слайд 5 Tasks
Method
Results for WS2 from mechanically exfoliation
Results for WS2

from chemical vapor deposition
Conclusion

Слайд 6 Method
Measurement apparatus, in which the photoluminescence from a

MethodMeasurement apparatus, in which the photoluminescence from a monolayer TMD is

monolayer TMD is collected by an objective lens (OL),

selectively transmitted through a rotatable optical bandpass filter (BPF), finally imaged on a CCD sensor.

Слайд 7 Angular orientations of the BPF determines the center-wavelength

Angular orientations of the BPF determines the center-wavelength of its pass

of its pass band, which varies with incidence angle

Слайд 8 Concept of the angular selective transmission
Changing the BPF

Concept of the angular selective transmissionChanging the BPF angle lights up

angle lights up a random subset of pixels on

the CCD; red, green and blue conceptually correspond to positions on the monolayer TMD that emits in differing energy ranges. When no filter is present, all energies are picked up.